X-Ray Fluorescence Spectrometer (XRF)
AELAB offers X-Ray Fluorescence Spectrometer systems for fast, non-destructive elemental analysis across laboratory, industrial, precious-metal, coating and field-testing applications.
Choose from benchtop, handheld, precious-metal and coating/RoHS XRF configurations according to sample type, target elements, analytical range and required testing workflow.
What Is an X-Ray Fluorescence Spectrometer?
X-Ray Fluorescence Spectrometry is an analytical technique used to identify and quantify elements in a sample by measuring the characteristic secondary X-rays emitted after excitation by an X-ray source.
Because XRF can analyze many materials with little or no chemical preparation, it is widely used for rapid elemental screening, material verification, alloy identification, precious-metal testing, coating analysis and industrial quality control.
Why Choose XRF for Elemental Analysis?
XRF is particularly useful when fast multi-element analysis, minimal sample preparation and non-destructive testing are important. Handheld and benchtop configurations allow the technique to be adapted to both laboratory and field workflows.
Compare AELAB X-Ray Fluorescence Spectrometers
Explore AELAB XRF configurations for precious-metal testing, laboratory analysis, alloy identification, coating thickness measurement and RoHS screening.
AELAB CUBE680 Mobile Spectrum Analyzer
A compact XRF analyzer designed for rapid, non-destructive analysis of gold, silver, platinum, palladium and related precious-metal materials.
- Analysis range: 0.01%–99.9%
- X-ray tube voltage: 5–50 kV
- Suitable for solid and powder samples
- Typical test time: 5–60 seconds
- Non-destructive precious-metal analysis
AELAB EDS8800PLUS XRF Analyzer
An application-oriented XRF system for coating thickness measurement, material screening and selected RoHS-related laboratory workflows.
- Coating thickness range: 0.005–50 μm
- X-ray tube voltage: 5–50 kV
- Solid, powder and liquid sample capability
- Typical test time: 5–100 seconds
- Multi-element material screening
AELAB TrueX Handheld Alloy Analyzer
A portable XRF analyzer for rapid alloy identification, positive material identification and field-based metal analysis.
- Handheld portable configuration
- Designed for on-site material analysis
- Suitable for alloy identification and PMI
- Rapid screening without moving large samples
- Field and industrial inspection workflow
AELAB AE-EDX-2800B XRF Spectrometer
A benchtop XRF configuration for routine laboratory analysis, material screening and controlled quality-control workflows.
- Benchtop laboratory configuration
- Stable sample positioning
- Suitable for routine QC workflows
- Multi-element material screening
- Designed for repeatable laboratory testing
Which AELAB XRF Configuration Is Right for You?
Compare XRF configurations according to sample type, measurement location and required analytical output.
| XRF Type | Recommended For | Typical Workflow | Main Advantage |
|---|---|---|---|
| Precious Metal XRF | Gold, jewelry, refining & precious metals | Countertop / laboratory | Rapid non-destructive composition testing |
| Handheld XRF | Alloys, PMI, field inspection & mining | Portable / on-site | Bring the analyzer directly to the sample |
| Benchtop XRF | Routine laboratory QC & material screening | Controlled laboratory | Stable and repeatable testing workflow |
| Coating / RoHS XRF | Coatings, components & compliance screening | Laboratory / industrial QC | Application-specific elemental and thickness analysis |
XRF Analysis for a Wide Range of Applications
AELAB XRF systems support analytical workflows across laboratory, industrial, field and quality-control environments.
Gold & Precious Metals
Gold purity, karat verification, jewelry screening and precious-metal composition analysis.
Metals & Alloys
Alloy identification, positive material identification, incoming inspection and metal quality control.
Mining & Minerals
Rapid elemental screening of ores, minerals and geological samples in field or laboratory environments.
Coating Thickness
Measurement and quality control of plated and coated surfaces across industrial components.
RoHS & Electronics
Screening of materials and components for selected restricted elements and compliance-related workflows.
Industrial Quality Control
Incoming-material verification, production control and finished-product screening.
How to Select the Right XRF Spectrometer
The correct XRF configuration depends on your sample, target elements, expected concentration range, testing location and required analytical output.
Define Your Sample
Determine whether you need to analyze metals, alloys, powders, minerals, coatings, electronics or precious metals.
Choose Test Location
Select a handheld XRF for portable field analysis or a benchtop system for controlled laboratory testing.
Define Target Elements
Identify the elements you need to measure and the approximate concentration range expected in your samples.
Define Analytical Output
Decide whether you require composition, alloy identification, precious-metal purity, coating thickness or screening results.
XRF vs AAS vs ICP-OES
XRF is particularly attractive for rapid solid-sample screening, while AAS and ICP-OES are commonly used for solution-based elemental analysis where different sensitivity and quantification requirements apply.
| Factor | XRF | AAS | ICP-OES |
|---|---|---|---|
| Sample Preparation | Often minimal | Usually solution / digestion | Usually solution / digestion |
| Non-Destructive Testing | Common in many applications | No | No |
| Multi-Element Screening | Fast | Typically sequential | Strong multi-element capability |
| Portable Options | Yes | Generally laboratory | Laboratory |
| Typical Strength | Rapid material screening | Targeted elemental analysis | High-throughput multi-element analysis |
Your Partner for XRF Elemental Analysis
Selecting an XRF analyzer requires matching instrument configuration to your materials, analytical targets and actual testing workflow.
Multiple XRF Configurations
Choose from handheld, benchtop, precious-metal and coating-oriented XRF platforms.
Non-Destructive Analysis
Analyze many valuable and finished samples without destructive chemical preparation.
Fast Multi-Element Screening
Rapidly screen and evaluate multiple elements in a single analytical workflow.
Application-Oriented Selection
Select XRF systems according to sample type, measurement location and required analytical output.
X-Ray Fluorescence Spectrometer FAQ
What is an XRF spectrometer used for?
What is the difference between handheld and benchtop XRF?
Can XRF test gold without damaging it?
Does XRF require sample preparation?
Can XRF measure coating thickness?
Can AELAB recommend an XRF system for my application?
Request an XRF Recommendation & Quotation
Tell us what you need to analyze and AELAB will help identify a suitable XRF configuration based on your sample type, target elements, concentration range, testing location and analytical requirements.
Request an XRF Recommendation & QuoteTell Us About Your XRF Application
Share your sample type, target elements and testing requirements. AELAB can use this information to help identify a suitable XRF configuration.
